Advances in X-Ray Analysis: Volume 36 by Anthony J. Klimasara (auth.), John V. Gilfrich, Camden R. PDF
By Anthony J. Klimasara (auth.), John V. Gilfrich, Camden R. Hubbard, Ron Jenkins, Deane K. Smith, Ting C. Huang, Michael R. James, Gerald R. Lachance, Paul K. Predecki (eds.)
Mathematical thoughts in XRay Spectrometry: examine within the Quantitative research of person debris by means of XRay Fluorescence Spectrometry (M. Lankosz et al.). Analysis of sunshine components through XRay Spectrometry: XRFA of Carbon in Steels (F. Weber et al.). XRS ideas and Instrumentation: Diffraction Peaks in XRay Spectroscopy (R.G.Tissot, R.P. Goehner). OnLine, business, and different purposes of XRS: program of XRF within the Aluminum (F.R. Feret). XRay Characterization of skinny Films: Grazing occurrence XRay Characterization of fabrics (D.K. Bowen, M. Wormington). WholePattern becoming, part research by means of Diffraction Methods: part identity utilizing WholePattern Matching (D.K. Smith et al.). Polymer purposes of XRD. HighTemperature and NonAmbient functions of XRD. tension and pressure selection by means of Diffraction equipment, top Broadening research. XRD strategies and Instrumentation. seventy one extra articles. Index.
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Additional info for Advances in X-Ray Analysis: Volume 36
MATHEMATICAL TECHNIQUES IN X-RAY SPECTROMETRY 20 require additional consideration of a background continuum in the analysis. Filtered spectra may be subjected to least-squares analysis without consideration of the background continuum and without loss of significant spectral information (McCarthy and Schamber; 1981). g. Davis, 1973). The solution is given by solving for the "b" coefficients in the following matrix equation. LN l:Rl l:R2 l:R3 ..... l:RN l:Rl l:Rl *Rl l:Rl *R2 l:Rl *R3 .. LRl*RN l:R2 l:R2*Rl l:R2*R2 l:R2*R3 ..
Data may be stored in either ASCII or DATASAVE (Quick, 1988) formats. The analyze menu contains options designed for manipulation and analysis of spectra. Individual spectra may be recalled and analyzed. Zero and gain corrections may be performed on individual stored spectra. A digital filter may be applied to a I. MATHEMATICAL TECHNIQUES IN X-RAY SPECTROMETRY 24 spectrum and the results viewed. Elemental references used for standardization may be created, and spectra may be combined by addition or subtraction.
The observed spectrum may be corrected for these offsets according to: Ec = z + Eo x (1 + ( g / 105 » (3) where Eo is the energy of a given channel in the observed spectrum and Ec is the energy of the same channel in the corrected spectrum. EDS spectra are normally expressed in terms of uniformly separated channels, each of which is located at precisely the same energy in all spectra. For example, the 20th channel may be located at BOO eV and separated from its neighbors by 40 eV. This uniform data presentation is another strict requirement for least-squares analysis of filtered spectra, and although Eo values are always located at appropriate and uniformly spaced energies, the calculated Ec values are generally not.
Advances in X-Ray Analysis: Volume 36 by Anthony J. Klimasara (auth.), John V. Gilfrich, Camden R. Hubbard, Ron Jenkins, Deane K. Smith, Ting C. Huang, Michael R. James, Gerald R. Lachance, Paul K. Predecki (eds.)